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Laboratory of Michael Shribak

Contact: Tel: 508-289-7242 | E-mail: mshribak@mbl.edu
Dr. Shribak is a principal investigator of NIH RO1 grant on orientation-independent differential interference contrast and combined DIC-Pol microscopy. His current interests also include developing real-time polarized light microscopy for life cell imaging, 3-dimensional polarization microscopy, interferometric technique for measuring two-dimensional distributions of refractive indices based on a Jamin-Lebedeff microscope, correction of polarization aberrations in microscopes, and theory of polarization fluorescence.

Associate Research Scientist Mykhailo Shribak

Michael Shribak Education:

1991   Ph.D. Optics, Moscow University of Geodesy and Cartography, Moscow, Russia
   
1982   M.S. Physical Optics, Lviv State University, Lviv, Ukraine

Complete Publication List (partially downloadable)
Curriculum Vitae (pdf format)

Selected Publications:

M. Shribak, S. Inoue, “Orientation-Independent Differential Interference Contrast Microscopy”, Applied Optics, 45, 460-469 (2006) (featured on cover page). (PDF)

M.Shribak, “Orientation-independent differential interference contrast microscopy technique and device”, US Patent Application #2005-0152030 (patent is granted).

M. Shribak and R. Oldenbourg, “Mapping polymer birefringence in three-dimensions using a polarization microscope with oblique illumination,” in Biophotonics Micro- and Nano-Imaging, D. Anselmetti, Ed., Proc. SPIE 5462, 57-67 (2004).

M. Shribak and R. Oldenbourg, “Techniques for fast and sensitive measurements of two-dimensional birefringence distributions,” Applied Optics 42, 3009-3017 (2003). (PDF)

M.Shribak, and R.Oldenbourg, “Retardance measurement system and method”, US Patent #7202950 (licensed to CRi, Woburn, MA).

M.Shribak, and R.Oldenbourg, “Retardance measurement system and method”, US Patent Application #2006-0126068 (patent is granted; licensed to CRi, Woburn, MA).

M.Shribak, R.Oldenbourg, P.J.Cronin, C.C.Hoyt, and P.J.Miller “Instantaneous polarization measurement system and method”, US Patent #7079247 (licensed to CRi, Woburn, MA).

R.Oldenbourg, M.Shribak, C.Hoyt, and P.Torok “Enhancing polarized light microcopy”, US Patent #6924893 (licensed to CRi, Woburn, MA).

S. Inoué, O. Shimomura, M. Goda, M. Shribak, and P.T. Tran, “Fluorescent polarization of green fluorescent protein,” Proceedings of the National Academy of Sciences of the USA, 99, 4272 – 4277 (2002).

M. Shribak, S. Inoué, and R. Oldenbourg, “Polarization aberrations caused by differential transmission and phase shift in high NA lenses: theory, measurement and rectification,” Optical Engineering, 41, 943-954 (2002).

M. Shribak, Y. Otani, and T. Yoshizawa, “Autocollimation polarimeter for measuring two-dimensional distribution of birefringence,” Optics & Spectroscopy, 89, 155-159 (2000).

M.I.Shribak, “Use of gyrotropic birefringent plate as quarter-wave plate”, Soviet Journal of Optical Technology, 53, 443-446 (1986).

Complete Publication List
Curriculum Vitae (pdf format)